I'm glad to have been invited by the GUMP to talk about the consequences and the mitigation of FIB irradiation induce defects in materials, from an atomistic point of view, during its 62th meeting in Orsay, near Paris, on the 13^th June 2019.

The GUMP (Groupe des Utilisateurs de Microscopie électronique Philips-FEI) is a french user group of Philips-FEI electron microscope. The 62th meeting is organized from the 11^th to the 13^th of June, 2019, in Orsay. This particular meeting focuses on the irradiation phenomena in electron microscopy, and thus propose an excellent framework to exchange about the insights brought by computational atomistic approaches in general, and my expertise in the domain of FIB irradiation damage in particular.